Publication details

Conference Paper (international conference)

Model-based fatigue fractographs texture analysis

Haindl Michal, Lauschmann H.

: Structural, Syntactic, and Statistical Pattern Recognition. Proceedings, p. 842-849 , Eds: Caelli T., Amin A., Duin R. P. W.

: Springer, (Berlin 2002)


: Joint IAPR International Workshops SSPR 2002 and SPR 2002, (Windsor, CA, 06.08.2002-09.08.2002)

: CEZ:AV0Z1075907

: GA106/00/1715, GA ČR, GA102/00/0030, GA ČR

: fractography, Markov random fields, texture

(eng): A novel model-based approach for estimation of the velocity of crack growth from microfractographical images is proposed. These images are represented by a Gaussian Markov random field model and the crack growth rate is modelled by a linear regression model in the Gaussian-Markov parameter space.

: 09K

: BD